|
|
.
|
|
|
0 (hodnocen0 x )
|
|
|
EB
|
|
|
EB
|
|
|
ONLINE
|
|
|
|
|
|
Weinheim : Wiley-VCH, 2017
|
|
|
1 online zdroj (250 stran)
|
| Externí odkaz |
 Plný text PDF
|
|
* Návod pro vzdálený přístup
|
|
|
|
|
|
|
|
|
|
ISBN 9783527699773 (e-kniha) oBook)
|
|
|
ISBN 9783527699780 (e-kniha)
|
|
|
ISBN !3527699805 (chyb.)
|
|
|
ISBN !3527340912 (chyb.)
|
|
|
ISBN !3527699791 (chyb.)
|
|
|
|
|
|
Obsahuje bibliografie a rejstřík
|
|
|
Popsáno podle tištěné verze
|
|
|
* Atomic force microscopy
|
|
|
|
|
|
001479586
|
|
|
History and Status of the CAFM / Chengbin Pan, Yuanyuan Shi, Fei Hui, Enric Grustan-Gutierrez, Mario Lanza -- Fabrication and Reliability of Conductive AFM Probes / Oliver Krause -- Fundamentals of CAFM Operation Modes / Guenther Benstetter, Alexander Hofer, Donping Liu, Werner Frammelsberger, Mario Lanza -- Investigation of High-k Dielectric Stacks by C-AFM: Advantages, Limitations, and Possible Applications / Mathias Rommel, Albena Paskaleva -- Characterization of Grain Boundaries in Polycrystalline HfO2 Dielectrics / Shubhakar Kalya, Sean Joseph O’Shea, Kin Leong Pey -- CAFM Studies on Individual GeSi Quantum Dots and Quantum Rings / Rong Wu, Shengli Zhang, Yi Lv, Fei Xue, Yifei Zhang, Xinju Yang -- Conductive Atomic Force Microscopy of Two-Dimensional Electron Systems: From AlGaN/GaN Heterostructures to Graphene and MoS2 / Filippo Giannazzo, Gabriele Fisichella, Giuseppe Greco, Patrick Fiorenza, Fabrizio Roccaforte ---Nanoscale Three-Dimensional Characterization with Scalpel SPM / Umberto Celano, Wilfried Vandervorst -- Conductive Atomic Force Microscopy for Nanolithography Based on Local Anodic Oxidation / Matteo Lorenzoni, Francesc Pérez-Murano -- Combination of Semiconductor Parameter Analyzer and Conductive Atomic Force Microscope for Advanced Nanoelectronic Characterization / Vanessa Iglesias, Xu Jing, Mario Lanza -- Design and Fabrication of a Logarithmic Amplifier for Scanning Probe Microscopes to Allow Wide-Range Current Measurements / Lidia Aguilera, Joan Grifoll-Soriano -- Enhanced Current Dynamic Range Using ResiScope" and Soft-ResiScope" AFM Modes / Louis Pacheco, Nicolas F Martinez --
|
|
|
Multiprobe Electrical Measurements without Optical Interference / David Lewis, Andrey Ignatov, Sasha Krol, Rimma Dekhter, Alina Strinkovsky -- KPFM and its Use to Characterize the CPD in Different Materials / Yijun Xia, Bo Song ---Hot Electron Nanoscopy and Spectroscopy (HENs) / Andrea Giugni, Bruno Torre, Marco Allione, Gerardo Perozziello, Patrizio Candeloro, Enzo Di Fabrizio
|
|
|
(OCoLC)1001349572
|
Dotazy a připomínky